• Semiconductor technology development
• Semiconductor process integration
• Incoming inspection
• Failure analysis
• Device reliability and lifetime testing
• Nanotechnology and MEMs research
• Mobile ion characterization
• Doping profile extractions
• High and low k dielectric characterization
• Isothermal testing
• Flash memory testing
• Pulse testing of III-V devices
• Organic LED characterization
• Hall Effect and van der Pauw testing
• Semiconductor device modeling
• High power MOSFET/BJT characterization
• Interface charge trap characterization
• Solar cell/photovoltaic device characterization
Price: £21,700.00 (Excluding: VAT at 20%)
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