Keithley 2600-PCT-3B Parametric Curve Tracer Configurations
Availability:
In Stock / Short Lead Time
High Voltage - High Voltage Mode: 3 kV/120 mA - High Current Mode: 200 V/10 A
High Voltage - High Voltage Mode: 3 kV/120 mA - High Current Mode: 200 V/10 A
High Power Device Characterization
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
Features of Keithley PCT Parametric Curve Tracer Configurations:
- Complete solutions engineered for optimum price and performance
- Field upgradable and reconfigurable -- convert your PCT to a reliability or wafer sort tester
- Configurable power levels:
- From 200V to 3kV
- From 1A to 100A
- Wide dynamic range:
- From µV to 3kV
- From fA to 100A
- Full range of capacitance-voltage (C-V) capability:
- fF to µF
- Supports 2-, 3-, and 4-terminal devices
- Up to 3kV DC bias
- High performance test fixture supports a range of package types
- Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others
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- Power semiconductor device characterization and testing
- Characterization of GaN and SiC, LDMOS and other devices
- Reliability studies on power devices
- Incoming inspection and device qualification