Keithley 4200A-SCS Parameter Analyzer
Keithley 4200A-SCS Parameter Analyzer
See your innovations come to life. The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development.
The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables you to dig deeper into your research with speed and confidence.
The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so you can add the instruments you need now – or later. With the 4200A-SCS Parameter Analyzer, making connections to your bold discoveries has never been easier.
Key Features
- Ready-to-use, modifiable application tests, projects and devices that reduce test development time
- Industry’s first instrument with built-in measurement
- videos from world-wide Application engineers, in four languages, to reduce learning curve
- Pin to pad contact check ensures reliable measurements
- Multiple measurement functions
- Data display, analysis and arithmetic functions
Key Performance Specifications
I-V Source Measure Unit (SMU)
- ± 210 V/100 mA or ± 210 V/1 A modules
- 100 fA measure resolution
- 0.1 fA measure resolution with optional preamp
- 10 mHz – 10 Hz very low frequency capacitance measurements
- 4-quadrant operation
- 2 or 4-wire connections
C-V Multi-frequency Capacitance Unit (CVU)
- AC impedance measurements (C-V, C-f, C-t)
- 1 kHz – 10 MHz frequency range
- ± 30 V (60 V differential) built-in DC bias, expandable to ± 210 V (420 V differential)
- Simple switching between I-V and C-V measurements with the optional CVIV Multi-Switch
Pulsed I-V Ultra-fast Pulse Measure Unit (PMU)
- Two independent or synchronized channels of high-speed pulsed I-V source and measure
- 200 MSa/sec, 5 ns sampling rate
- ±40 V (80 V p-p), ±800 mA
- Transient waveform capture mode
- Arbitrary waveform generator Segment ARB® mode
- for multi-level pulse waveform with 10 ns programmable resolution
High Voltage Pulse Generator Unit (PGU)
- Two channels of high-speed pulsed V source
- ±40 V (80 V p-p), ± 800 mA
- Arbitrary waveform generator Segment ARB®
- mode for multi-level pulse waveform with 10 ns programmable resolution
I-V/C-V Multi-Switch Module (CVIV)
- Easily switch between I-V and C-V measurements without re-cabling or lifting prober needles
- Move the C-V measurement to any terminal without re-cabling or lifting prober needles
Remote Preamplifier/Switch Module (RPM)
- Automatically switches between I-V, C-V, and ultra-fast pulsed I-V measurements
- Extends current sensitivity of the 4225-PMU to tens of picoamps
- Reduces cable capacitance effects
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- MOSFET, BJT Transistors
- Materials Characterization
- Non-volatile Memory Devices
- Resistivity & Hall Effect Measurements
- NBTI/PBTI
- III-V Devices
- Failure Analysis
- Nanoscale Devices
- Diodes and pn Junctions
- Solar Cells
- Sensors
- MEMS Devices
- Electrochemistry
- LED and OLED