Keithley 2601B-PULSE System SourceMeter

Availability: In Stock / Short Lead Time
  • Single Channel SourceMeter
  • Max Current Source: 10A
  • Max Voltage Source: 40V
  • Max Resolution Current/Voltage: 100 fA / 100 nA V
  • Power: Pulser: 100 W instantaneous SMU: 200 W instantaneous

The new Keithley 2601B-PULSE System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.

Achieve high pulse fidelity without manual pulse tuning

The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 ms, you can properly characterize your device or circuit under test.

  • Output 10 A @ 10 V with a 10 μs pulse width
  • Pulse rise time <1.7 ms to characterize with confidence
  • High fidelity pulse output without tuning at any current level

Incorporates the functionality of a fast pulser and SMU in one instrument

The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.

  • Pulser 0.05% basic measure accuracy with 1 MS/s digitizing
  • SMU 100 nA low current range with 100 fA sensitivity
  • Rear panel BNC connections for quick cable setup

Embedded scripting and connectivity for unmatched production throughput

Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.

  • Eliminates time-consuming bus communications to and from the PC
  • Advanced data processing and flow control
  • Connect up to 32 TSP-Link nodes
  • Reconfigure easily as test requirements change

Key features:

  • 10A @ 10V at 10µs pulse
  • DC capability up to ±40 V @ ±1.0 A, 40 Watt
  • No tuning required for inductive loads up to 3 μH. Remote test head not required
  • Dual 1 Msample/sec digitizers for high speed I/V pulse measurements (Pulser function only)
  • TSP (Test Script Processing) technology embeds complete test programs inside the instrument for best-in-class system-level throughput

Applications:

Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications

The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 ms Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.

  • Programmable pulse current source up to 10 A and 10 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 100 fA
  • Built-in TSP® processing capability reduces PC-instrument bus communication

Simplified Pulsed/DC I/V Characterization of LEDs

The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.

  • Programmable current source up to 10 A and 10 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 100 fA
  • 1 Megasample/second digitizers for fast source and measure data collection
  • Built-in TSP processing capability reduces PC-instrument bus communication

On Wafer Semiconductor Testing

Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.

  • Built-in TSP processing capability reduces PC-instrument bus communication
  • TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments