Keithley 2601B-PULSE System SourceMeter
- Single Channel SourceMeter
- Max Current Source: 10A
- Max Voltage Source: 40V
- Max Resolution Current/Voltage: 100 fA / 100 nA V
- Power: Pulser: 100 W instantaneous SMU: 200 W instantaneous
The new Keithley 2601B-PULSE System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
Achieve high pulse fidelity without manual pulse tuning
The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 ms, you can properly characterize your device or circuit under test.
- Output 10 A @ 10 V with a 10 μs pulse width
- Pulse rise time <1.7 ms to characterize with confidence
- High fidelity pulse output without tuning at any current level
Incorporates the functionality of a fast pulser and SMU in one instrument
The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.
- Pulser 0.05% basic measure accuracy with 1 MS/s digitizing
- SMU 100 nA low current range with 100 fA sensitivity
- Rear panel BNC connections for quick cable setup
Embedded scripting and connectivity for unmatched production throughput
Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.
- Eliminates time-consuming bus communications to and from the PC
- Advanced data processing and flow control
- Connect up to 32 TSP-Link nodes
- Reconfigure easily as test requirements change
Key features:
- 10A @ 10V at 10µs pulse
- DC capability up to ±40 V @ ±1.0 A, 40 Watt
- No tuning required for inductive loads up to 3 μH. Remote test head not required
- Dual 1 Msample/sec digitizers for high speed I/V pulse measurements (Pulser function only)
- TSP (Test Script Processing) technology embeds complete test programs inside the instrument for best-in-class system-level throughput
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Applications:
Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications
The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 ms Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.
- Programmable pulse current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- Built-in TSP® processing capability reduces PC-instrument bus communication
Simplified Pulsed/DC I/V Characterization of LEDs
The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.
- Programmable current source up to 10 A and 10 µs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- 1 Megasample/second digitizers for fast source and measure data collection
- Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.
- Built-in TSP processing capability reduces PC-instrument bus communication
- TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments