Keithley 2606B High Density SourceMeter
- High Density System SourceMeter
- Sourcing Current: 100nA to 3A
- Sourcing Voltage: 100mV to 20V
- Power: 20.2W
SourceMeter four channel system, 20V
The 2606B High Density System SourceMeter (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. As manufacturers need to optimize plant floor space and reduce test time and costs, the 2606B improves density by 3 times, increases throughput, and minimizes the need to add additional racks of test equipment. This SMU is the perfect solution for production testing of Laser Diodes, LEDs, 2- and 3-terminal semiconductors and much more.
Key Features
- Four-channel SMU instrument in a single 1U full rack chassis
- Stackable; no 1U spacing requirements between units
- Tightly-integrated voltage/current source and measure instruments offer best in class performance with 6½-digit resolution
- 20 V @ 1 A and 6 V @ 3 A power envelopes, 20 watts
- 0.015% DCV basic accuracy
- Up to 28 open drain digital I/O bits
- Correlated results to the 2602B System SourceMeter SMU Instrument
- TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput
- TSP-Link expansion technology for multi-channel parallel test without a mainframe
- Front Panel LAN (LXI-C), USB 2.0 TMC488 protocol, and digital I/O interfaces
- Built-in web browser based software enables remote control through any browser, on any computer from anywhere in the world
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Typical Applications:
Laser Diode (VCSEL) Production Test for 3D Sensing Applications
Industry's best DC test system for Laser Diode (LD) production test uses high speed and high accuracy SMUs for both current sourcing and voltage-current monitoring of laser diode modules, photodiode current. SMUs are the most cost-effective LIV instrumentation with high system synchroization and throughput.
- Programmable current source up to 3 A and 100 µs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Built-in TSP processing capability reduces PC-instrument bus communication
High Volume Production Test of LEDs
The 2606B SMU is an industry leading instrument for LED DC characterization and production test. It's configurable to source current or voltage coupled with voltage and current measurement at 0.015% basic measure accuracy for a variety of test needs. In addition, the Test Script Processor (TSP®) technology provides throughput advantages.
- Programmable current source up to 3 A and 100 µs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Built-in TSP processing capability reduces PC-instrument bus communication
- Daisy-chain up to 64 channels for high volume parallel test
Transistor Characterization with Multi-Channel SMU Instruments
With its integrated source and measure, voltage or current, precision and accuracy, a 2606B System SourceMeter SMU instrument is ideal for testing transistors on wafer or in packaged parts including capturing drain family of curves, threshold voltage, gate leakage and transconductance.
- Programmable current source up to 3 A and 100 µs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Best accuracy 0.015% with 6½-digit resolution
- Built-in TSP processing capability reduces PC-instrument bus communication