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  • Keithley 2470 High Voltage SourceMeter

Keithley 2470 High Voltage SourceMeter


Availability: Normally in Stock / Short Lead Time

  • HIgh-Voltage SourceMeter

  • Sourcing Current: 1A

  • Sourcing Voltage: 1000 V

  • Power: 20W

SMU Selection Made Easy


The 2470 High Voltage SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier.

With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more. These
new capabilities, combined with Keithley’s decades of expertise in developing high precision, high-accuracy SMU instruments, make the 2470 a “go-to instrument” for high-voltage source and low-current measurement applications in the lab and in the test rack.

All-in-One SMU Instrument

The 2470, Keithley’s fourth generation of SourceMeter SMUs, leverages the proven capabilities of the original 2410 High Voltage SourceMeter SMU Instrument. SMU
instruments offer a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current measurements. This all-in-one instrument can
be used as a:

• Precision power supply with V and I readback
• True current source
• Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
• Precision electronic load
• Pulse generator
• Trigger controller

Key Features

• Wide coverage up to 1100 V / 1 A DC 20 W max.
• 10 fA measure resolution
• 0.012% basic measure accuracy with 6½-digit resolution
• Five-inch, high-resolution capacitive touch screen GUI
• Source and sink (4-quadrant) operation
• SCPI and TSP® scripting programming modes
• TSP-Link for multi-channel I-V testing
• Front panel input banana jacks; rear panel high-voltage input triaxial connections
• Built-in context-sensitive help
• Front-panel USB 2.0 memory I/O port for transferring data, test scripts, and test configurations



Ideal for current/voltage characterization and functional test of a wide range of today's modern electronics and devices, including:


  • Power semiconductors and materials: SiC, GaN, power MOSFETs, power diodes

  • IGBT

  • Thyristors, SCRs

  • Transient suppression devices

  • Circuit protection devices: TVS, MOVs, fuses, etc.

  • Connectors, switches, relays

  • Power management modules

  • Batteries


  • I-V characterization

  • Forward voltage

  • Breakdown voltage

  • Leakage current

  • Isolation

  • Hi-Pot

  • Dielectric withstanding