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  • Keithley 2635B Single Channel SourceMeter

Keithley 2635B Single Channel SourceMeter

£10,100.00

Availability: Normally in Stock / Short Lead Time


  • Single Channel System SourceMeter

  • 6½-digit resolution

  • Sourcing Current: ± 1nA to ± 10A

  • Sourcing Voltage:  ± 200mV to ± 200V

  • Power: 30W


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Description

SourceMeter single channel system, 200V/1.5A/10A pulse, low current

Series 2600A System SourceMeter instruments are Keithley’s latest I-V source-measure instruments foruse as either bench-top I-V characterization tools or as building block components of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP ExpressSoftware Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, Series 2600A’s Test Script Processor (TSP) architecture along with other new capabilities such as parallel test execution and precision timing provides the highest throughput in the industry, lowering the cost of test. To simplify the testing, verification, and analysis of semiconductor components, the optional ACS Basic Edition software is also available.

Series 2600A System SourceMeter instruments replace the popular Series 2600 System SourceMeter instruments with a superset of features. 2600A instruments readily execute all 2600 commands.

  • Combines a power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller - all in one instrument
  • Backward code compatible to Series 2600 System SourceMeter® Instruments for drop-in replacement
  • TSP® Express software tool for Quick and Easy I-V Test
  • Precision timing and channel synchronization (<500ns)
  • Parallel test execution for unmatched throughput
  • 20,000 rdg/s provides faster test times and ability to capture transient device behaviour
  • Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
  • TSP-Link® bus allows up to 32 units/64 channels of channel expansion per GPIB or IP address
  • Test Script Processor (TSP®) runs complete test programs (scripts) in the instrument for unparalleled system automation
  • USB port for saving data and test scripts
  • LXI Class C compliance provides high speed data transfer and enables quick, easy remote testing, monitoring, and troubleshooting

Data Sheet Accessory Description
2000-BENCHKIT MULTI MODEL BENCH CONVERSION KIT
237-ALG-15 LOW NOISE TRIAX CABLE 15M(50FT)
237-ALG-2 LOW NOISE TRIAX CABLE
237-TRX-BAR 3 LUG F/3LUG F TRIAX
2600-ALG-2 LOW NOISE TRIAX CABLE WITH ALLIGATOR CLIPS
2600-BAN BANANA JACK INTERFACE CABLE
2600-DEMO-TRX TRIAX TO PHOENIX DEMO ONLY
2600-FIX-TRX CABLE CONNECTING 2600 SMU TO HI AND LO TRIAX
2600-KIT 2600 SERIES SCREW TERMINAL CONNECTOR KIT
2600-TLINK 2600 SERIES TRIGGER I/O TO TLINK INTERFACE CABLE
2600-TRIAX TRIAX ADAPTER FOR 2600 SERIES
2600B-PM-2 1.5A /200V PROTECTION MODULE WITH TERMINAL BLOCK CONNECTORS
4299-1 HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT
4299-10 DUAL FIXED RACK-MOUNT KIT FOR ONE 2U GRAPHICAL DISPLAY INSTRUMENT AND ONE SERIES 26XX INSTRUMENT
4299-2 HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS
4299-5 1U VENT PANEL
4804 MALE BNC TO FEMALE TRIAX ADAPT
7007-1 SHIELDED GPIB CABLE,1M (3.2FT)
7007-2 SHIELDED GPIB CABLE,2M (6.5FT)
7007-3 SHIELDED GPIB CABLE,3M (10FT)
7007-4 SHIELDED GPIB CABLE, 4M 13 FT
7010 IEEE ADAPTER
7078-TRX-1 3 SLOT TRIAX CABLE, 1 FT
7078-TRX-10 3 SLOT TRIAX CABLE, 10FT
7078-TRX-12 3 LUG TRIAX CABLE, 12FT
7078-TRX-20 3 SLOT TRIAX CABLE, 20FT
7078-TRX-3 3 SLOT TRIAX CABLE, 3FT
7078-TRX-5 3 SLOT TRIAX CABLE
7078-TRX-6IN 3 SLOT LOW NOISE TRIAX CABLE,6IN (.15M)
7078-TRX-BNC 3-SLOT MALE TRIAX TO BNC ADAPTER
7078-TRX-GND 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED)
7078-TRX-TBC 3 LUG TRIAX BULKHD CONN
8101-4TRX 4 PIN TRANSISTOR FIXTURE
8606 MODULAR PROBE KIT
KPCI-488LPA LOW PROFILE IEEE-488 INTERFACE BOARD
KUSB-488B IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER
Datasheet
Manuals
Applications

Typical Applications:


I-V functional test and characterization of a wide range of devices, including:



  • Discrete and passive components:


    • Two-leaded – Sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors

    • Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more


  • Simple ICs – Optos, drivers, switches, sensors, converters, regulators

  • Integrated devices – small scale integrated (SSI) and large scale integrated (LSI)


    • Analog ICs

    • Radio frequency integrated circuits (RFICs)

    • Application specific integrated circuits (ASICs)

    • System on a chip (SOC) devices


  • Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays

  • Wafer level reliability


    • NBTI, TDDB, HCI, electromigration


  • Solar Cells

  • Batteries

  • And more...