Your Cart ×

You have no items in your shopping cart.

  • Home
  • Keithley 4200-SCS Semiconductor Characterization System

Keithley 4200-SCS Semiconductor Characterization System

Availability: Normally in Stock / Short Lead Time

  • Semiconductor technology development
  • Semiconductor process integration
  • Incoming inspection
  • Failure analysis
  • Device reliability and lifetime testing
  • Nanotechnology and MEMs research
  • Mobile ion characterization
  • Doping profile extractions
  • High and low k dielectric characterization
  • Isothermal testing
  • Flash memory testing
  • Pulse testing of III-V devices
  • Organic LED characterization
  • Hall Effect and van der Pauw testing
  • Semiconductor device modeling
  • High power MOSFET/BJT characterization
  • Interface charge trap characterization
  • Solar cell/photovoltaic device characterization

Price on application - Please call 0800 583 4455 or email