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  • Keithley DMM7512 Dual Channel 7½-Digit Sampling Multimeter

Keithley DMM7512 Dual Channel 7½-Digit Sampling Multimeter


Availability: Normally in Stock / Short Lead Time

High precision Dual Channel 7½-Digit Sampling Multimeter
• A dual channel 7½ digit sampling multimeter
• Two independent, identical DMMs in one 1u high form factor
• Two 1 Msample/second digitizers

Keithley DMM7512 High precision 7-1/2 digit DMM

  • Two high-precision, 7½-digit DMMs in a 1U high, full rack width chassis
  • No space requirements between instruments minimizes rack space
  • Capture waveforms or identify transients with two 1 Msample/s 18-bit digitizers
  • Trigger a waveform measurement on a signal level, a rising or falling edge, a window, or a digital trigger
  • Store up to 27.5M timestamped readings on a waveform
  • Basic one-year DC Voltage accuracy as low as 14 ppm
  • 10 nV, 0.1 μΩ, and 1 pA sensitivities for making high resolution low level measurements such as measurements of portable device sleep currents
  • High accuracy, low resistance measurements with offset compensated ohms, four-wire measurement, and dry circuit functions
  • Auto-calibration improves accuracy and stability by minimizing temperature and time drift
  • USBTMC-compliant and LAN LXI-compliant interfaces
  • Reduce test time by executing test scripts with the Embedded Test Script Processor, which saves PC command communication overhead
  • Tight synchronization between the two DMMs using TSP-Link® communication
  • Reduce life cycle costs with a two-year calibration interval

Two DMM7510s built into one compact enclosure

The DMM7512 consists of two, independent, identical, 7½-digit DMM7510 digital multimeters (DMMs) with a few less measurement functions. The two DMM7512 DMMs have the same accuracy, sensitivity, and speed as the DMM7510 so that the DMM7512 can be seamlessly integrated into a test system that previously used DMM7510s.

  • Sample complex waveforms with the 1Msample/s, 18-bit digitizer; store up to 27.5 million readings
  • Test components used in low power circuits with 0.1 µΩ and 1 pA sensitivities
  • Maximize test quality with high test uncertainty ratios using 1-year accuracy DC volts as good as 14 ppm
  • Built-in Test Script Processor (TSP®) enables test sequence execution without controller interaction, reducing test time and communication overhead, while availing the controller for other tasks

Double Test System Density

Save valuable rack space with two DMMs in a 1U high rack space. Compared to two 2U high DMM7510s, you can get twice the measurement capability in half the space.
  • Combine sourcing and measurement with the 2606B High Density, 4-channel Source Measure Unit (SMU) and the DMM7512 for four channels of sourcing and two channels of measurement in as little as 2U of rack space
  • No extra spacing for thermal management is required between either DMM7512s or 2606Bs

Significantly Reduce Test Time

The two DMMs in each DMM7512 have built-in intelligence to execute test programs without PC interaction using its Test Script Processor (TSP®) Technology. In addition, each DMM features a TSP-Link® hardware interface so that one instrument can control other instruments in a master-subordinate configuration.
  • Control up to 32 instruments in a TSP-Link test system
  • Synchronize measurements with a latency under 500 ns
  • Eliminate time-consuming communications between the instruments and a PC
  • DMM7512 TSP code is compatible with DMM7510 TSP code

Determine power consumption

Use the two DMMs of the DMM7512 to independently capture dynamic battery drain current and battery voltage and compute power consumption of low power, wireless IoT, and implantable/portable medical products, a critical parameter for battery-operated devices.

  • Capture current and voltage waveforms with up to 1 Msample/s, 18-bit digitizing

  • Synchronize waveform capture using TSP-Link with less than 500 ns latency between initiation of waveform sampling

  • Measure low sleep mode current with 1pA DCI sensitivity or 0.1nA current digitization sensitivity

Increase throughput with multi-device testing

Use the two DMMs in a DMM7512 to test two devices-under-test (DUTs) to double test throughput and maximize test system capacity. Or, use multiple DMM7512s and test even more DUTs with one test system. Save on the number of test racks and save critical factory floor space with the 1U high dual DMMs.

  • 1U rack height with no spacing between instruments required

  • Two DMMs per instrument

  • Control multiple instruments with a test script and TSP-Link to reduce bus communication time and save test time