Keysight B2900C / B2900CL Series Precision Source Measure Units

The Keysight B2900C/CL Series Precision source measure units deliver high-performance sourcing and measurement of voltage and current, with ranges up to ±210 V and ±3 A DC (or ±10.5 A pulsed). With resolutions as fine as 10 fA and 100 nV, along with a colour LCD interface and task-based viewing modes, these instruments simplify test, debug, and characterisation work. They’re designed for precision without compromising on ease of use or bench space.

With six models available—ranging from the B2901CL to the B2912C—the series supports flexible configurations for different test needs. Backward compatibility with SCPI commands makes integration smooth, and high measurement throughput ensures efficient production testing. Whether you need basic capability or advanced performance, the B2900C/CL Series offers an optimised balance of price and functionality.

Key Features:

• High Precision Measurement and Sourcing: The B2900C/CL Series offers ultra-precise measurement with resolutions down to 10 fA and 100 nV, tailored across six models with single or dual channels.
• High-Speed Sampling: Capture low-frequency transient events easily thanks to high-speed sampling rates up to 100,000 points per second. Sampling performance varies by model, giving you options based on speed, resolution, and application demands.
• 4-Wire Measurement for Accurate Low-Resistance Testing: Kelvin connection (4-wire) capability ensures accurate low-resistance measurements by eliminating voltage errors from lead resistance.
• Stable Testing of High-Capacitance Loads: The high capacitance mode prevents oscillation when measuring large capacitive loads, ensuring stability and reliable data.
  
• Fast, Reliable Throughput for Production Environments: Optimised for both lab and production use, the B2900C/CL Series delivers fast, repeatable measurements even at short integration times. It’s the fastest in its class, helping you meet high-volume test demands without compromising accuracy.
  
• Large Trace Buffer for Efficient Data Handling: With up to 100,000 data points of internal storage (10,000 on the B2901CL), large datasets can be captured and retrieved quickly. This reduces test cycle times and improves overall system throughput.
  
• Versatile SCPI Command Support: The B2900C/CL Series supports both conventional and advanced SCPI command sets, making it easy to integrate into existing systems. Legacy compatibility reduces development time, while advanced features unlock full instrument performance.
  
• Flexible Connectivity: Standard banana jack inputs make for simple, cost-effective connections, with the added flexibility to adapt for low current testing. Optional banana-to-triaxial adapters allow accurate measurements below 1 nA without compromising signal integrity.