- Keysight E3640A 30W Power Supply, 8V, 3A or 20V, 1.5A£1,005.00
The Keysight 30W, single output E3640A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight E3643A 50W Power Supply, 35V, 1.4A or 60V, 0.8A£1,005.00
The Keysight 50W, single output E3643A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight E3642A 50W Power Supply, 8V, 5A or 20V, 2.5A£1,005.00
The Keysight 50W, single output E3642A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight E3645A 80W Power Supply, 35V, 2.2A or 60V, 1.3A£1,184.00
The Keysight 80W, single output E3645A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight E3644A 80W Power Supply, 8V, 8A or 20V, 4A£1,184.00
The Keysight 80W, single output E3644A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
- Binder MK Series Dynamic Climate Chambers
Environmental simulation chamber for cyclical temperature
The BINDER environmental simulation chamber of the MK series is suitable for heat or cold testing between -40 °C and 180 °C. The APT.line™ preheating chamber technology uniquely simulates a natural environment. For cyclical temperature testing, this environmental simulation chamber is a smart alternative to complex individual solutions.Learn More - Keysight DAQM905A 2 GHz Dual 1:4 RF Mux, 50 Ohm Module for DAQ970A and DAQ973A£851.00
The Keysight DAQM905A RF multiplexer module Data Acquisition System offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight DAQM908A 40 Channel Single-Ended Multiplexer Module for DAQ970A and DAQ973A£637.00
Use the Keysight DAQM908A module Data Acquisition System for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - Keysight J7201A/B/C Attenuation Control Units DC to 6/18/26.5 GHz£8,539.00
Designed for WLAN and WiMAX™ device manufacturing test and mobile handset base transceiver station (BTS) handover test.
For expert advice and pricing, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk
Learn More - High Definition MWIR Science-Grade Camera FLIR X8580™
The FLIR X8580 is a high-speed, high-definition mid-wave IR camera with 1280 × 1024 resolution, ideal for scientists and engineers. It captures detailed imagery for accurate thermal analysis, custom radiometric measurements, and detecting points of failure in materials. It's also great for thermal mapping in materials research, including stress analysis in hypervelocity impact testing.
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