FLIR X6980-HS Series InSb™ High-Speed MWIR Science-Grade Camera

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The FLIR X6980-HS InSb is a lightning-fast midwave IR camera tailored for precise thermal analysis and custom measurements, boasting 640 × 512 resolution and rapid high-speed frame rates. Featuring a four-position motorised filter wheel and compatibility with FLIR motorised focus lenses, it ensures superior recordings, saves time, and enhances efficiency in dynamic environments.

FLIR High-Speed MWIR Science-Grade Camera X6980-HS InSb™

The FLIR X6980-HS InSb stands as an exceptional longwave infrared camera engineered to meet the demands of scientists and engineers requiring swift high-speed imaging for precise thermal analysis and custom radiometric measurements. This cutting-edge thermal imaging device combines the superior 640 × 512 resolution from the FLIR indium antimonide (InSb) detector with unmatched high-speed frame rates, ensuring the capture of crisp stop-motion images of fast-paced events with unparalleled accuracy. Its advanced capabilities enable users to achieve shorter snapshot speeds and wider temperature bands, facilitating the recording of detailed thermal data across a broad spectrum of dynamic scenarios.

Equipped with a versatile four-position motorised filter wheel and compatible with FLIR motorized focus lenses, the X6980-HS InSb provides users with unparalleled flexibility and efficiency in dynamic acquisition environments. Not only does it deliver high-quality recordings, but it also saves valuable time by streamlining the data acquisition process. Whether utilized in laboratory settings or in the field, this state-of-the-art thermal imaging solution empowers researchers and engineers to optimize their workflow, enhance productivity, and achieve superior results in their thermal analysis endeavors.

Full Frame Rate Streaming

Experience unmatched image clarity and speed with the FLIR X6980-HS MWIR camera, boasting advanced full-frame rate streaming capabilities. Equipped with high-speed interfaces like 10 GigE, CXP 2.1, and CameraLink Full, researchers can seamlessly stream thermal imagery at the highest frame rates, capturing even the fastest events with exceptional detail and precision.

SSD Storage for Extended Recording

To accommodate prolonged monitoring sessions and facilitate in-depth analysis, the X6980-HS presents extended SSD recording capabilities. With this feature, researchers can capture detailed thermal events for over two hours directly onto a removable 4 TB NVMe SSD, without encountering any dropped frames. This extended recording capability not only facilitates comprehensive data collection but also guarantees that all critical thermal events are captured in their entirety, mitigating the risk of missing crucial information. By providing ample storage space and uninterrupted recording, the X6980-HS enables researchers to conduct thorough analyses and derive meaningful insights from thermal data without limitations.

Data Transfer in the Blink of an Eye

Effortlessly incorporate thermal data into your analysis workflow using the X6980-HS' seamless data integration capabilities. Easily transfer complete recordings from the NvMe SSD to your computer, ensuring that your thermal data is consistently accessible for thorough analysis and interpretation. This streamlined transfer process eradicates any delays in accessing vital thermal information, empowering researchers to swiftly and efficiently make informed decisions.

Precise Timing System

Equipped with a sophisticated timing system, the X6980-HS ensures accurate and synchronized data capture, regardless of environmental factors. Its proprietary triggering, synchronization, and IRIG time stamping capabilities guarantee precise and on-time recording of thermal events, instilling confidence in researchers that their data is captured with the utmost accuracy. With this level of precision, researchers can conduct robust analysis and draw reliable conclusions from their thermal imaging studies, facilitating informed decision-making and advancing scientific understanding.

 

For more information regarding pricing and lead times, get in touch at +44 (0) 800 583 4455 or sales@sjelectronics.co.uk 

Key Features and Functions

Output rating : 36 W

  • Voltage: 60 V
  • Current: 0.6 A
  • Power: 36 W

Programming accuracy : ± (% of output + offset)

  • Voltage: 0.05% + 20 mV
  •  Current: 0.05% + 0.4 mA

Ripple & noise (20 Hz to 20 MHz)

  • Voltage rms: 1.55 mV
  • Voltage peak-to-peak: 30 mV
  • Current rms: 200 µA

Readback accuracy : ± (% of output + offset)

  • Voltage: 0.05% + 12 mV
  • Current: 0.05% + 0.3 mA

Keysight E36100B Series basic DC power supplies feature a compact size (2U, ¼-rack), a high-contrast OLED display that is viewable from any angle, and modern USB and LAN (LXI Core) connectivity. Use the highly accurate low-current measure feature for demanding measurements. Protect your DUT with built-in overvoltage and overcurrent protection, and count on the built-in overtemperature protection to keep your power supply safe. Get connected to your instrument quickly via the intuitive front-panel interface, a Web interface running on a browser, a SCPI or IVI program, Keysight IO Libraries, or a BenchVue app running on your PC or mobile device. Choose the best model for your needs: five models offer up to 5 A or 100 V.

Clean, reliable power supply

  • Low, normal mode noise specifications assure quality power for precision circuitry applications enabling you to power your design with confidence
  • Accurate voltage/current programming and read back capability provides excellent control to precisely power your device under test
  • Protection for your device under test (DUT) includes overvoltage, overcurrent, and overtemperature protection

Convenient benchtop capabilities

  • USB and LAN (LXI Core)
  • BenchVue software support and Web interface control

Compact, intuitive package

  • Save space on your bench, 2U ¼ rack
  • Easily view the high contrast OLED display
  • Intuitive on-screen menu
Specifications
  X6980HS X6981HS
X6982HS X6983HS
Resolution 640 x 512
Detector Pitch 12 µm
Spectral Range 1.5 – 5.0 µm 3.0 – 5.0 µm 1.5 – 5.0 µm 3.0 – 5.0 µm
Detector Type FLIR Indium Antimonide (InSb)
Camera f-number f/2.5
f/4.1
Dynamic Range 14-bit
Frame Rate [Full Window] Programmable; 0.0015 Hz to 1004 Hz
Integration Time 270 ns to approx. Full Frame
Standard Temperature Range [with band matched optics] -20°C to 300°C (-4°F to 572°F) -20°C to 350°C (-4°F to 662°F) -10°C for microscopes -20°C to 350°C (-4°F to 662°F) -20°C to 350°C (-4°F to 662°F) -10°C for microscopes
Optional Temperature Range [with band matched optics] 45°C to 600°C (ND1)
250°C to 2000°C (ND2)
500°C to 3000°C (ND3)

Filtering 4-position motorised filter wheel, standard 1-inch filters, user swappable
Focus Motorised (compatible w/ manual)

Imaging & Optical

  X6980HS X6981HS X6982HS X6983HS
Available Lenses
Manual (broadband): 25 mm, 50 mm, 100 mm

Motorised (broadband): 25 mm, 50 mm, 100 mm
Manual (3-5 µm): 17 mm, 25 mm, 50 mm, 100 mm, 200 mm, Macro
 
Macro Motorised (3-5 µm): 17 mm, 25 mm, 50 mm, 100 mm, 200 mm
Manual (broadband): 25 mm, 50 mm, 100 mm

Motorised (broadband): 25 mm, 50 mm, 100 mm
Manual (3-5 µm): 17 mm, 25 mm, 50 mm, 100 mm, 200 mm,
50 mm Macro 
 
Macro Motorised (3-5 µm): 17 mm, 25 mm, 50 mm, 100 mm, 200 mm
 
Camera f-number f/2.5
f/4.1
Camera size excl lens (L x W x H) 249 mm × 157 mm × 147 mm (9.8 in × 6.2 in × 5.8 in)
Close-up Lenses/Microscopes No microscopes available 1x, 3x No microscopes available
1x, 3x, 5x, 1 × 20 cm LWD
Detector Pitch 25 µm
Detector Type FLIR Indium Antimonide (InSb)
Digital Zoom 1x, Auto (best fit)
Direct to SSD Recording Direct to SSD Recording
Yes, removable 4 TB NVMe SSD included, approx. 2-hours of zero dropped frames record time

On-Camera Image Storage
RAM (volatile): 64 GB, up to 23,000 frames full frame
NVMe U.2 SSD (user-removable/non-volatile): 4 TB U.2 SSD included, up to 1.4 M frames full frame
Dynamic Range 14-bit
Filtering 4-position motorised filter wheel, standard 1-inch filters, user swappable
Focus Motorised (compatible w/ manual)
Frame Rate (Full Window) Programmable; 0.0015 Hz to 1004 Hz
Image Time Stamp Internal precision timestamp. IRIG-B AM decoder, TSPI accurate, Free wheel if sync signal is lost
Integration Time 270 ns to approx. Full Frame
Lens Interface FLIR FPO-M (4-tab bayonet, motorised)
Operability ≥99.5% (≥99.95% typical)
Overlay Customisable with the ability to toggle off
Palette Selectable 8-bit
Pixel Clock 355.2 MHz
Radiometric Data Streaming Simultaneous 10 Gigabit Ethernet (GigE Vision), Camera Link, CoaXPress (CXP 2.1) Single link @ 10 Gbps or Dual Link @ 5 Gbps
Readout Modes Asynchronous Intergrate While Read; Asynchronous Integrate Then Read
Readout Type Snapshot
Resolution 640 x 512
Sensor Cooling Closed cycle rotary
Spectral Range 1.5 - 5.0 µm 3.0 - 5.0 µm  1.5 - 5.0 µm 3.0 - 5.0 µm 
Standard Video HDMI, SDI
Subwindow Modes Flexible windowing down to 32 × 4 (steps of 32 columns, 4 rows)
Thermal Sensitivity_NETD [typical] 20 mK typical
Video Modes HD-SDI: 720p@50/59.9 Hz, 1080p@25/29.9 Hz, 1080p@60 Hz
SD-SDI: 480i@60 Hz, 576i@50 Hz

Measurement & Analysis

  X6980HS X6981HS X6982HS X6983HS
Accuracy ≤100°C ±2°C (±1°C typical), ≥100°C ±2% of reading (±1% typical)
Automatic Gain Control Manual, Linear, Plateau equalisation, DDE
Optional Temperature Range [with band matched optics] 45°C to 600°C (ND1)
250°C to 2000°C (ND2)
500°C to 3000°C (ND3)
Standard Temperature Range [with band matched optics] -20°C to 300°C (-4°F to 572°F) -20°C to 350°C (-4°F to 662°F), -10°C for microscopes -20°C to 350°C (-4°F to 662°F) -20°C to 350°C (-4°F to 662°F), -10°C for microscopes

Communication & Data Storage

Synchronisation Modes
Sync In, Sync Out, Tri-Level Sync, Video Sync
Trigger Mode(s)
Trigger In, Software generated, Time generated

General

Weight (Without Lens)
6.35 kg (14 lbs)

Power

Power
24 VDC (≤50 W steady state)

Environmental & Certifications

Mounting
2 × ¼ in. -20, 1 × 3/8 in. -16, 4 × #10 -24, Side: 3 × ¼ in. -20 (each side)
Operating Temperature Range -20°C to 50°C (-4°F to 122°F)
 
 
 
 
 

KEY APPLICATIONS

  • NON-DESTRUCTIVE TESTING
  • TARGET SIGNATURE
  • RADIOMETRY
  • STRESS MAPPING