Keithley 2635B Single Channel SourceMeter
- Single Channel System SourceMeter
- 6½-digit resolution
- Sourcing Current: ± 1nA to ± 10A
- Sourcing Voltage: ± 200mV to ± 200V
- Power: 30W
SourceMeter single channel system, 200V/1.5A/10A pulse, low current
Series 2600A System SourceMeter instruments are Keithley’s latest I-V source-measure instruments foruse as either bench-top I-V characterization tools or as building block components of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP ExpressSoftware Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, Series 2600A’s Test Script Processor (TSP) architecture along with other new capabilities such as parallel test execution and precision timing provides the highest throughput in the industry, lowering the cost of test. To simplify the testing, verification, and analysis of semiconductor components, the optional ACS Basic Edition software is also available.
Series 2600A System SourceMeter instruments replace the popular Series 2600 System SourceMeter instruments with a superset of features. 2600A instruments readily execute all 2600 commands.
- Combines a power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller - all in one instrument
- Backward code compatible to Series 2600 System SourceMeter® Instruments for drop-in replacement
- TSP® Express software tool for Quick and Easy I-V Test
- Precision timing and channel synchronization (<500ns)
- Parallel test execution for unmatched throughput
- 20,000 rdg/s provides faster test times and ability to capture transient device behaviour
- Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
- TSP-Link® bus allows up to 32 units/64 channels of channel expansion per GPIB or IP address
- Test Script Processor (TSP®) runs complete test programs (scripts) in the instrument for unparalleled system automation
- USB port for saving data and test scripts
- LXI Class C compliance provides high speed data transfer and enables quick, easy remote testing, monitoring, and troubleshooting
Data Sheet | Accessory | Description |
2000-BENCHKIT | MULTI MODEL BENCH CONVERSION KIT | |
237-ALG-15 | LOW NOISE TRIAX CABLE 15M(50FT) | |
237-ALG-2 | LOW NOISE TRIAX CABLE | |
237-TRX-BAR | 3 LUG F/3LUG F TRIAX | |
2600-ALG-2 | LOW NOISE TRIAX CABLE WITH ALLIGATOR CLIPS | |
2600-BAN | BANANA JACK INTERFACE CABLE | |
2600-DEMO-TRX | TRIAX TO PHOENIX DEMO ONLY | |
2600-FIX-TRX | CABLE CONNECTING 2600 SMU TO HI AND LO TRIAX | |
2600-KIT | 2600 SERIES SCREW TERMINAL CONNECTOR KIT | |
2600-TLINK | 2600 SERIES TRIGGER I/O TO TLINK INTERFACE CABLE | |
2600-TRIAX | TRIAX ADAPTER FOR 2600 SERIES | |
2600B-PM-2 | 1.5A /200V PROTECTION MODULE WITH TERMINAL BLOCK CONNECTORS | |
4299-1 | HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT | |
4299-10 | DUAL FIXED RACK-MOUNT KIT FOR ONE 2U GRAPHICAL DISPLAY INSTRUMENT AND ONE SERIES 26XX INSTRUMENT | |
4299-2 | HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS | |
4299-5 | 1U VENT PANEL | |
4804 | MALE BNC TO FEMALE TRIAX ADAPT | |
7007-1 | SHIELDED GPIB CABLE,1M (3.2FT) | |
7007-2 | SHIELDED GPIB CABLE,2M (6.5FT) | |
7007-3 | SHIELDED GPIB CABLE,3M (10FT) | |
7007-4 | SHIELDED GPIB CABLE, 4M 13 FT | |
7010 | IEEE ADAPTER | |
7078-TRX-1 | 3 SLOT TRIAX CABLE, 1 FT | |
7078-TRX-10 | 3 SLOT TRIAX CABLE, 10FT | |
7078-TRX-12 | 3 LUG TRIAX CABLE, 12FT | |
7078-TRX-20 | 3 SLOT TRIAX CABLE, 20FT | |
7078-TRX-3 | 3 SLOT TRIAX CABLE, 3FT | |
7078-TRX-5 | 3 SLOT TRIAX CABLE | |
7078-TRX-6IN | 3 SLOT LOW NOISE TRIAX CABLE,6IN (.15M) | |
7078-TRX-BNC | 3-SLOT MALE TRIAX TO BNC ADAPTER | |
7078-TRX-GND | 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED) | |
7078-TRX-TBC | 3 LUG TRIAX BULKHD CONN | |
8101-4TRX | 4 PIN TRANSISTOR FIXTURE | |
8606 | MODULAR PROBE KIT | |
KPCI-488LPA | LOW PROFILE IEEE-488 INTERFACE BOARD | |
KUSB-488B | IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER |
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Typical Applications:
I-V functional test and characterization of a wide range of devices, including:
- Discrete and passive components:
- Two-leaded – Sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors
- Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more
- Simple ICs – Optos, drivers, switches, sensors, converters, regulators
- Integrated devices – small scale integrated (SSI) and large scale integrated (LSI)
- Analog ICs
- Radio frequency integrated circuits (RFICs)
- Application specific integrated circuits (ASICs)
- System on a chip (SOC) devices
- Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays
- Wafer level reliability
- NBTI, TDDB, HCI, electromigration
- Solar Cells
- Batteries
- And more...