Keithley 4200-SCS Semiconductor Characterization System
Availability:
In Stock / Short Lead Time
- Semiconductor technology development
- Semiconductor process integration
- Incoming inspection
- Failure analysis
- Device reliability and lifetime testing
- Nanotechnology and MEMs research
- Mobile ion characterization
- Doping profile extractions
- High and low k dielectric characterization
- Isothermal testing
- Flash memory testing
- Pulse testing of III-V devices
- Organic LED characterization
- Hall Effect and van der Pauw testing
- Semiconductor device modeling
- High power MOSFET/BJT characterization
- Interface charge trap characterization
- Solar cell/photovoltaic device characterization
Price on application - Please call 0800 583 4455 or email sales@sjelectronics.co.uk