Tektronix P6330 High-Performance Differential Probe

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  • <140 ps rise time
  • 3.5 GHz bandwidths (typical)
  • Low input capacitance: <0.3 pF differential

Tektronix' proven expertise in probes brings you the highest fidelity in high-speed differential probing. The P7350, P7330, and P6330 high-bandwidth differential probes offer excellent signal fidelity, meeting the needs of engineers in design and debug of technologies with very fast clock speeds and edge rates. They provide high-bandwidth, low circuit loading, low-noise differential probing solutions for high-speed circuit designers.

P7330 and P6330

The P7330 and P6330 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The P7330 and P6330 provide high-bandwidth, low circuit loading, and low-noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices.

Key Performance Specifications:

  • <140 ps rise time
  • 3.5 GHz bandwidths (typical)
  • Low input capacitance: <0.3 pF differential
  • 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz (P7330, P6330 typical)

Key Features:

  • High-bandwidth, low-noise differential probing
  • Small probe head allows easy probing of SMDs

Applications:

  • Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
  • Semiconductor characterization and validation
  • PCI Express
  • Serial ATA
  • IEEE 1394 
  • USB 2.0 (The P7350 is not recommended for USB 2.0 compliance testing)
  • MIPI® D-PHY
  • DDR
  • Disk drive design