Keithley Automated Characterization Suite (ACS) Software
ACS software with permanent license.
The Keithely Automated Characterization Suite (ACS) Software is a flexible, interactive software test environment designed for semiconductor device characterization, reliability test, parametric test, and component functional test. ACS supports a wide range of Keithley instrumentation such as the 2600 Series source measure units and 4200 Series parameter analyzers, as well as Keithley's S500 and S530 systems. Exceptional testing and analysis flexibility and an intuitive GUI make novice users productive almost immediately.
- Intuitive GUI simplifies test plan development, test execution, and results analysis
- Develop and execute tests at the device, site, wafer, and cassette level
- Supports a wide range of instruments and system configurations including multi-SMU parallel test systems
- Full control of semi-automatic and fully-automatic probers
- Interactive and real-time data plotting
ACS supports a wide range of semi-automatic and fully automatic probers for semiconductor device measurements across an entire wafer. Or control the prober interactively for testing individual devices. Monitor testing progress with individual device results and multi-device statistics during run-time.
What is ACS?
ACS is a powerful software framework for engineers performing a wide range of tests for detailed characterization of semiconductor devices. Use ACS with Keithley’s broad line of industry-leading SMU instruments and systems. Automate testing at the wafer or cassette level controlling automated probers with standard ACS. For manual or single device testing, consider ACS Basic Edition. And for advanced multi-DUT wafer level reliability (WLR), use standard ACS with the ACS-2600-RTM option.
